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  4. 22.8 Using ALM specific OpKey Keywords

22.8 Using ALM specific OpKey Keywords

Quick Start Screencast:

Overview:

There are few new keywords added in OpKey which helps user to perform particular task. By using these keywords, you can log defect in ALM, create ALM Test Run, create ALM Test Run Step, upload attachment and update ALM Test Run.

These keywords are described as follows:

  1. CreateALMTestRun: Used to create a Test Run
  2. CreateALMTestRunStep: Used to create a Test Run Step
  3. UploadALMAttachment: Used to upload the execution attachment file
  4. UpdateALMTestRun: Used to update the ALM Test Run
  5. UploadALMTestRunAttachment: Used to upload attachment at the run level. There are two arguments for this keyword, one is TestRunID and ExternalFilePath.
  6. UpdateALMRunStepStatus: Used to update the status of the specific step for the run that is being created. It has three arguments, TestRunId, TestStepName, and Status.

Before using these keywords in a Test Case, you must ensure that ALM is configured successfully and your Test Case is mapped with the ALM Test Plan and Requirement, as required.

For detailed information about ALM, you can refer: Working with ALM

Let us create a Test Set under the Test Lab by adding Test Plan(s).

ALM Server allows you to execute your Test Plan by adding them to Test Sets under Test Labs. Let us see how to add Test Plan(s) to the Test Sets and execute them.

Navigate to the Test Lab section. Here, you can view a folder named as Root. You can expand and add Test Sets under this folder.

Here, we have added a Test Set named as LAb Test under ALM Tes folder. You can view details of this newly created Test set.

Let us view the list of the existing Test Plan(s). Here, you can view two Test Plans (test pln and try).

Add desired Test Plan(s) from the list. Here, both test plans are added to the test set.

Further you can execute your Test Set by using ALM specific keywords integrated to OpKey Web.

Let us create a Test Case by adding these keywords.

1. CreateALMTestRun:

This keyword is used to create a Test Run in ALM. It takes two mandatory Data Input Arguments (TestSetId and TestPlanId).

Go to the Test Lab section in ALM and look for the Test Set ID. Navigate to the Test Plan in ALM and look for the Test Plan ID. Enter both IDs as data input arguments as shown below.

Save Output of this Test Step which can be further used. (Here, Run ID)

Adding a Function Library: 

Let us add a Function Library which would get Fail and it results logging a new defect in ALM. Here, you can view that the mandatory data input arguments are not provided so that it get failed.

2. CreateALMTestRunStep:

This OpKey keyword is used to create a Test Run Step in ALM. It takes two mandatory Data Input Arguments (TestRunId and TestStepName).

Go to the Data Input Argument tab, choose Step Output and map Step Output of first step (as Run ID) here as TestRunId. Enter Step 1 as TestStepName as data input argument.

3. UploadALMAttachment:

This OpKey keywords helps you to upload attachment in ALM. It takes three Data Input Arguments (TestRunID, TestStepName and ExternalFilePath).

Go to the Data Input Argument tab, choose Step Output and map step out put of your first test step (as Run ID).

Enter Step 1 as TestStepName and provide file path to be uploaded on ALM/

4. UpdateALMTestRun:

This OpKey keyword is used update the ALM Test Run. It takes only one Data Input Argument (TestRunId).

Go to the Data Input Argument tab, choose Step Output and map step out put of your first test step (as Run ID).

Save your Test case and execute it.

Once execution process has completed, you can view that there is a new Test Run created.

Open the Test Run to view detailed information. Here, you can view Status, Test Set Name, Configuration Name, Status, Test Instance, Execution Date, Time etc.

You can open the attachment file that has been uploaded (here Known Issues.xls) along with execution Result pdf file. Go to the Steps tab view those files.

Click on the Defect link to open and view detailed information about the logged defect.

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